The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2020

Filed:

May. 22, 2018
Applicant:

Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;

Inventors:

Yuta Masuda, Kawasaki, JP;

Takuya Kamimura, Kobe, JP;

Takeshi Otani, Kawasaki, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06Q 30/06 (2012.01); G06T 7/10 (2017.01); G06F 3/01 (2006.01); G06K 9/20 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00597 (2013.01); G06F 3/013 (2013.01); G06K 9/00248 (2013.01); G06Q 30/06 (2013.01); G06T 7/10 (2017.01); G06K 9/2018 (2013.01);
Abstract

A line-of-sight analysis method, performed by a computer, includes: identifying, when a selection event with respect to a first object out of a plurality of objects is detected, a second object different from the first object, based on a detection status of line-of-sight relative to the objects in a most recent time period of the selection event; and outputting information indicating the identified second object.


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