The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2020

Filed:

Aug. 01, 2017
Applicant:

Hitachi Solutions, Ltd., Tokyo, JP;

Inventor:

Toshiko Matsumoto, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/06 (2012.01); G06F 30/20 (2020.01); H04L 12/26 (2006.01); G06F 30/3312 (2020.01); G01R 31/3183 (2006.01);
U.S. Cl.
CPC ...
G06F 30/20 (2020.01); G06Q 10/063 (2013.01); G01R 31/318357 (2013.01); G06F 30/3312 (2020.01); G06Q 10/0631 (2013.01); H04L 43/0852 (2013.01);
Abstract

There is provided a data analysis apparatus, comprising an event occurrence setting module configured to cause a prescribed event to occur in a simulation for a work order that includes a process at which the prescribed event is to occur an event occurrence detection timing setting module configured to store an event occurrence detection timing indicating a time period between an occurrence of an event and detection of the event, a simulation executing processing module configured to execute a simulation when an occurrence of the event is detected, the simulation executing processing module being configured to execute a simulation that reflects an effect on the process when the event is addressed in accordance with the event occurrence detection timing recorded in the storage module, and a KPI calculating module configured to calculate a KPI of the process for the event occurrence detection timing, based on results of the simulation.


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