The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2020

Filed:

Sep. 18, 2017
Applicant:

Google Inc., Mountain View, CA (US);

Inventors:

Stephanie Zhang, Jersey City, NJ (US);

Jon Vaver, Lafayette, CO (US);

Assignee:

Google LLC, Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06G 7/00 (2006.01); G06F 16/2458 (2019.01); G06F 17/18 (2006.01); G06Q 30/02 (2012.01); G06F 16/242 (2019.01); G06F 17/16 (2006.01);
U.S. Cl.
CPC ...
G06F 16/2465 (2019.01); G06F 16/244 (2019.01); G06F 17/18 (2013.01); G06Q 30/02 (2013.01); G06Q 30/0201 (2013.01); G06F 17/16 (2013.01);
Abstract

Systems and methods for model validation includes generating a first and a second time series of segmentation states for a data set representative of a simulated population, e.g., a collection of membership counts corresponding to respective segments of the simulated population. The first and second time series of segmentation states are generated by respectively processing the data set through a first and a second simulation each comprising iterative application of a plurality of event functions. The first and the second simulation differ in at least one capacity, e.g., one including a first event function configured with a first parameter, and the second not. Analysis of differences between the first and second time series may be compared to analysis of one of the time series using a subject model. The comparison is then used to validate the model or demonstrate accuracies, inaccuracies, and/or model bias with respect to a performance metric.


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