The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 2020
Filed:
Aug. 03, 2018
Applicant:
Emc Ip Holding Company Llc, Hopkinton, MA (US);
Inventors:
Yubing Wang, Southborough, MA (US);
Philippe Armangau, Acton, MA (US);
Ajay Karri, South Grafton, MA (US);
Assignee:
EMC IP Holding Company LLC, Hopkinton, MA (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01); G06F 17/18 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 3/0641 (2013.01); G06F 3/0608 (2013.01); G06F 3/0683 (2013.01); G06F 17/18 (2013.01); G06N 20/00 (2019.01);
Abstract
A method is used in managing deduplication characteristics in a storage system. Deduplication entries stored in a deduplication cache are categorized into a set of deduplication groups based on a data deduplication probability associated with the deduplication entries. A machine learning system is used to dynamically adjust deduplication characteristics associated with the set of deduplication groups based on an I/O workload associated with the storage system.