The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 2020
Filed:
Apr. 11, 2018
Applicants:
Boe Technology Group Co., Ltd., Beijing, CN;
Hefei Xinsheng Optoelectronics Technology Co., Ltd., Anhui, CN;
Inventors:
Kai Wang, Beijing, CN;
Chunyang Nie, Beijing, CN;
Bingbing Yan, Beijing, CN;
Lixin Zhu, Beijing, CN;
Assignees:
BOE TECHNOLOGY GROUP CO., LTD., Beijing, CN;
HEFEI XINSHENG OPTOELECTRONICS TECHNOLOGY CO., LTD., Anhui, CN;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 1/067 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2806 (2013.01); G01R 1/06711 (2013.01); G01R 1/06788 (2013.01); G01R 31/2805 (2013.01);
Abstract
The present disclosure provides a test probe and an apparatus for testing a printed circuit board, wherein the test probe comprises a test pin; and an insulating protection sleeve with adhesive attached therein, wherein the insulating protection sleeve is sleeved on the test pin, and wherein a first end of the test pin protrudes from the insulating protection sleeve.