The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2020

Filed:

Mar. 23, 2018
Applicants:

Kabushiki Kaisha Toshiba, Minato-Ku, JP;

Toshiba Energy Systems & Solutions Corporation, Kawasaki-Shi, JP;

Inventors:

Setsu Yamamoto, Yokohama, JP;

Azusa Sugawara, Kawasaki, JP;

Jun Semboshi, Yokohama, JP;

Kentaro Tsuchihashi, Yokohama, JP;

Takeshi Hoshi, Yokohama, JP;

Masaru Otsuka, Ota, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/04 (2006.01); G01N 29/26 (2006.01); G10K 11/34 (2006.01); G01S 15/89 (2006.01); G01N 29/24 (2006.01); G01S 7/52 (2006.01);
U.S. Cl.
CPC ...
G01N 29/262 (2013.01); G01N 29/2437 (2013.01); G01N 29/2456 (2013.01); G01N 29/2468 (2013.01); G01S 15/8915 (2013.01); G01S 15/8927 (2013.01); G10K 11/346 (2013.01); G01N 2291/106 (2013.01); G01S 7/52047 (2013.01);
Abstract

An ultrasonic flaw detecting apparatus comprises an array prove, an element-group defining circuit, a calculator, a signal receiver and a generator. The array probe comprises a plurality of piezoelectric elements, each of the plurality of piezoelectric elements being configured to transmit and receive an ultrasonic wave to and from an inspection object. The element-group defining circuit is configured to select, as an element group, plural consecutive piezoelectric elements from the plurality of piezoelectric elements, set a reference position of the element group based on array arrangement information of the plurality of piezoelectric elements in the element group and based on a weighting value of each of the plurality of piezoelectric elements in the element group, and calculate a propagation path of an ultrasonic beam from the element group based on the reference position and a predetermined refraction angle. The calculator is configured to calculate a delay time of each of the plurality of piezoelectric elements in the element group in such a manner that the ultrasonic beam is configured to propagate along the propagation path. The signal receiver is configured to receive respective ultrasonic waves received with the plurality of piezoelectric elements as detection signals. The generator is configured to generate at least one composite signal for the ultrasonic beam having the propagation path based on the detection signal and the delay time.


Find Patent Forward Citations

Yamamoto, Setsu. (2020). Ultrasonic flaw detecting apparatus, ultrasonic flaw detecting method, and manufacturing method of product (U.S. Patent No. 10718741). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10718741

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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