The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2020

Filed:

Sep. 21, 2018
Applicant:

Toyota Jidosha Kabushiki Kaisha, Toyota-shi, Aichi-ken, JP;

Inventors:

Shinya Nagashima, Toyota, JP;

Toshihiro Ikai, Okazaki, JP;

Hisao Kato, Nagoya, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/403 (2006.01); G01Q 60/22 (2010.01); G01N 27/30 (2006.01); H01J 37/20 (2006.01); G01N 23/04 (2018.01); G01N 27/416 (2006.01); H01J 37/26 (2006.01); G01Q 80/00 (2010.01);
U.S. Cl.
CPC ...
G01N 27/30 (2013.01); G01N 23/04 (2013.01); G01N 27/403 (2013.01); G01N 27/416 (2013.01); G01Q 60/22 (2013.01); H01J 37/20 (2013.01); H01J 37/26 (2013.01); G01Q 80/00 (2013.01); H01J 2237/2003 (2013.01); H01J 2237/2008 (2013.01);
Abstract

A cell for electrochemical measurement is a cell for electrochemical measurement used for measurement by an electron beam that passes through an observation window, a MEMS chip for observation which includes a laminate including an electron-transmissive thin film and a substrate and in which a working electrode and a counter electrode are provided on a thin film and an MEMS chip for sealing which is a laminate including an electron-transmissive thin film and a substrate are disposed apart from each other, and there are areas in both laminates in which the substrates are not present, and an observation window including the thin film is formed in the areas, and the working electrode overlaps the observation window in both laminates and has a plurality of through-holes on an observation window in a direction in which an electron beam passes.


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