The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 2020
Filed:
Jun. 27, 2018
Anritsu Infivis Co., Ltd., Kanagawa, JP;
Itaru Miyazaki, Kanagawa, JP;
Akihiro Tanaka, Kanagawa, JP;
Takashi Kanai, Kanagawa, JP;
Hisashi Hayashi, Kanagawa, JP;
ANRITSU INFIVIS CO., LTD., Kanagawa, JP;
Abstract
To correctly acquire image data of an inspected article by preventing a difference in shade between images caused by a difference in position or sensitivity between sensor elements. An X-ray generation source irradiates an inspection region where an inspected article passes with an X-ray. X-ray detection means receives the X-ray passing through the inspection region using a plurality of sensor elements. Image data generation means generates image data of the inspected article from an output of the X-ray detection means. Incidence condition changing means changes two or more kinds of X-ray incidence conditions common for all of the plurality of sensor elements of the X-ray detection means in a state of absence of the inspected article in the inspection region. Correction data generation means acquires correction data that is needed for making a shade of an image uniform for each incidence condition.