The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 2020
Filed:
Mar. 07, 2016
Emage Vision Pte. Ltd., Singapore, SG;
Sergey Smorgon, Singapore, SG;
Bee Chuan Tan, Singapore, SG;
Chern Fei Chua, Singapore, SG;
Ya'akob Bin Mohamed, Singapore, SG;
EMAGE VISION PTE. LTD., Singapore, SG;
Abstract
An inspection system to inspect the consistency and thermal seal quality of blister packages, the system comprising an illumination module and a color imaging device suitably integrated with an optical module. The blister packages that are thermally sealed are sequentially presented to the color imaging device within its Field of View whereupon the inspection captures multiple images of the illuminated top side of the sealed blister package using the said image pickup devise. The images then undergo analysis to determine the gray scale values of the sealing area. By comparing the gray level values with predetermined gray level values that are programmed at setup, a decision is made to reject the inspected item if the analyzed gray level values is not substantially the same as the predetermined gray level values, or to accept the inspected item if the analyzed gray level values is substantially the same as the predetermined gray level values or rejecting the blister if determined otherwise.