The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 2020
Filed:
Sep. 18, 2018
Olympus Corporation, Tokyo, JP;
Yoko Abe, Hino, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
A disclosed microscopy method includes: setting a first capturing condition for previous capturing to generate a previous image for generating a primary image based on a subject, the previous capturing being sweep capturing that is capturing while changing a focal plane position with respect to the subject, such that brightness saturation does not occur in the previous image; causing an imaging apparatus to capture the previous image in accordance with the first capturing condition for the previous capturing set at the setting; setting a second capturing condition for primary capturing to generate the primary image on the basis of the previous image captured through the previous capturing by the imaging apparatus, the primary capturing being the sweep capturing; and causing the imaging apparatus to capture the primary image in accordance with the second capturing condition that has been set in the setting the second capturing condition.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile