The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2020

Filed:

Dec. 19, 2018
Applicant:

Analytik Jena Ag, Jena, DE;

Inventors:

Stefan Münch, Berlin, DE;

Michael Okruss, Potsdam, DE;

Assignee:

Analytik Jena AG, Jena, DE;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/04 (2006.01); G01J 3/22 (2006.01); G01J 3/02 (2006.01); G01J 3/18 (2006.01); G01J 3/14 (2006.01); G01J 3/12 (2006.01);
U.S. Cl.
CPC ...
G01J 3/04 (2013.01); G01J 3/0208 (2013.01); G01J 3/14 (2013.01); G01J 3/1809 (2013.01); G01J 3/22 (2013.01); G01J 2003/1208 (2013.01);
Abstract

The present disclosure discloses a spectrometer arrangement including an entrance-slit group including a slit wheel and a slit mask for introducing radiation into and for limiting the optical field of the spectrometer arrangement, a first dispersive element for spectrally decomposing the radiation in a main dispersion direction, and a second dispersive element for spectrally decomposing the radiation in a transverse dispersion direction that forms an angle with the main dispersion direction to yield a two-dimensional spectrum. The slit wheel is mounted rotatably about an axis of rotation and has a falcate opening having a width that changes depending on the angle. The slit mask includes an opening that is longer than a largest width of the falcate opening such that radiation radiates through the falcate opening of the slit wheel and the opening of the slit mask. The present disclosure further includes a corresponding method and an optical component group.


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