The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2020

Filed:

Sep. 13, 2017
Applicant:

Goertek Inc., Shandong, CN;

Inventors:

Jiudong Wang, Shandong, CN;

Bo Li, Shandong, CN;

Hui Qi, Shandong, CN;

Assignee:

Goertek Inc., Shandong, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 21/08 (2006.01); G01R 33/02 (2006.01); G01C 21/20 (2006.01); G01C 25/00 (2006.01);
U.S. Cl.
CPC ...
G01C 21/08 (2013.01); G01C 21/20 (2013.01); G01C 25/005 (2013.01); G01R 33/0206 (2013.01);
Abstract

The present invention discloses a method and an apparatus for measuring a posture angle of an object. The method comprises the following steps: arranging a sensor in a measured object, the sensor being used for measuring characteristic quantities of magnetic field in three dimensional directions; actuating the sensor at the beginning of the measurement, and acquiring, by using the sensor, a current measured value of the characteristic quantity of magnetic field of the measured object in a carrier coordinate system; acquiring reference values of the characteristic quantities of magnetic field of the measured object in a geographic coordinate system; and calculating a current posture angle of the measured object according to numerical values of the characteristic quantities of magnetic field indicated by the reference value and the measured value in each direction respectively.


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