The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2020

Filed:

May. 16, 2019
Applicant:

Klingelnberg Gmbh, Hückeswagen, DE;

Inventor:

Georg Mies, Wipperfürth, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/30 (2006.01);
U.S. Cl.
CPC ...
G01B 11/303 (2013.01);
Abstract

Roughness measurement probe () for scanning a surface (F), comprising an integratingly operating device () and an optical scanning device (), wherein the optical scanning device () is arranged directly on or in the integratingly operating device (), wherein the integratingly operating device () is designed, when scanning the surface (F), to predetermine a mean distance between the roughness measuring probe () and a larger region of the surface (F), and wherein the optical scanning device () is designed, when scanning the surface (F), to optically scan a smaller region of the surface (F) in a contactless manner, wherein the integratingly operating device () comprises an optical arrangement which is designed as a virtual skid in such a way that it images a light spot (LF) on the surface (F).


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