The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 2020
Filed:
Sep. 14, 2015
Applicant:
Ariosa Diagnostics, Inc., San Jose, CA (US);
Inventors:
Arnold Oliphant, San Jose, CA (US);
Andrew Sparks, San Jose, CA (US);
Eric Wang, San Jose, CA (US);
Craig Struble, San Jose, CA (US);
Assignee:
Ariosa Diagnostics, Inc., Pleasanton, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01); G01N 33/50 (2006.01); C12Q 1/6883 (2018.01); G16B 20/00 (2019.01); G16B 30/00 (2019.01); C12Q 1/686 (2018.01); C12Q 1/6806 (2018.01);
U.S. Cl.
CPC ...
C12Q 1/6883 (2013.01); C12Q 1/6806 (2013.01); C12Q 1/686 (2013.01); G16B 20/00 (2019.02); G16B 30/00 (2019.02); C12Q 2600/156 (2013.01);
Abstract
The present invention provides processes for determining accurate risk probabilities for fetal aneuploidies. Specifically, the invention provides non-invasive evaluation of genomic variations through chromosome-selective sequencing and non-host fraction data analysis of maternal samples.