The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2020

Filed:

May. 17, 2016
Applicant:

The Regents of the University of California, Oakland, CA (US);

Inventors:

Kenneth Loh, San Diego, CA (US);

Jesus Gonzalez, Bay Point, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C04B 14/00 (2006.01); C04B 14/02 (2006.01); G01N 27/20 (2006.01); G01N 27/04 (2006.01); C04B 20/10 (2006.01); C04B 28/02 (2006.01); C04B 111/94 (2006.01); C04B 111/00 (2006.01);
U.S. Cl.
CPC ...
C04B 14/026 (2013.01); C04B 20/1029 (2013.01); C04B 28/02 (2013.01); G01N 27/043 (2013.01); G01N 27/20 (2013.01); C04B 2111/00008 (2013.01); C04B 2111/94 (2013.01);
Abstract

A method for creating multifunctional cementitious composites that provide load-bearing and self-sensing properties. The method involves dispersing conductive nanomaterials (e.g., multi-walled carbon nanotubes) into a polymer (e.g., latex) material from which a thin film is created and deposited (e.g., sprayed) onto aggregates, which after drying, can be incorporated with cementitious materials and desired liquids and cast, along with sufficient number of electrodes, into a form for curing. After curing, the resultant structure can be electrically tested through the electrodes, for structural characteristics, including determination of damage severity and location using back-calculation utilizing electrical resistance tomography (ERT), or electrical impedance tomography (EIT), to generate a spatial resistivity map (distribution).


Find Patent Forward Citations

Loading…