The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 2020
Filed:
Jul. 12, 2017
Komori Corporation, Tokyo, JP;
Glory Ltd., Himeji-shi, Hyogo, JP;
Hiromitsu Numauchi, Tsukuba, JP;
Takashi Suto, Tsukuba, JP;
Sayuri Yanagiuchi, Himeji, JP;
Ryuzo Tanigawa, Himeji, JP;
KOMORI CORPORATION, Tokyo, JP;
GLORY LTD., Hyogo, JP;
Abstract
A print quality examination device is provided in a printing machine () provided with a printing unit () that performs printing on a mirror-reflection member () of a sheet () to which the mirror-reflection member () is added. The print quality examination device of the printing machine is provided with an examination camera () that images a picture printed on the sheet (), a light source () that irradiates the sheet () with light, and a print quality examination unit () that examines the quality of the picture printed by the printing unit () based on image data imaged by the examination camera (). The examination camera () or the light source () is configured to be movably supported on an arc about a detection point (P) imaged by the examination camera () for the sheet ().