The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 2020
Filed:
Feb. 17, 2017
Toshiba Medical Systems Corporation, Otawara-shi, JP;
Adam Petschke, Vernon Hills, IL (US);
Canon Medical Systems Corporation, Otawara-shi, JP;
Abstract
A method and apparatus is provided to generate material-component images from spectral computed tomography (CT) projection data, using material decomposition in both the sinogram and image domains. From material components in the sinogram domain, monoenergetic sinograms are generated, and then monoenergetic images are reconstructed from the monoenergetic sinograms. Next, the monoenergetic images are decomposed into material-component images. Material decomposition in the sinogram domain enables beam-hardening corrections, and material decomposition in the image domain enhances image quality using prior information regarding the images including (e.g., smoothness and volume constraints) and using image-domain calibrations. Additionally, the method can be improved using scatter correction and detector-response and energy-spectrum calibrations. Further, iterations of the method can be performed by feeding back the material-component images to improve the scatter correction.