The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 2020
Filed:
Oct. 06, 2015
Applicant:
Nanyang Technological University, Singapore, SG;
Assignee:
NANYANG TECHNOLOGICAL UNIVERSITY, Singapore, SG;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61B 3/00 (2006.01); G01B 9/00 (2006.01); A61B 8/13 (2006.01); G01B 9/02 (2006.01); A61B 3/10 (2006.01); G01N 21/47 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0066 (2013.01); A61B 3/0025 (2013.01); A61B 3/102 (2013.01); A61B 5/00 (2013.01); A61B 8/13 (2013.01); G01B 9/02044 (2013.01); G01B 9/02084 (2013.01); G01B 9/02091 (2013.01); G01N 21/47 (2013.01); A61B 5/7257 (2013.01); A61B 2562/0233 (2013.01); A61B 2576/00 (2013.01); G01N 21/4795 (2013.01);
Abstract
Methods are proposed to improve axial resolution in optical coherence tomography (OCT). In one aspect, the method comprises: obtaining a k-space interferogram of an OCT spectral image; uniformly reshaping the k-space interferogram to a quasi-stationary interferogram by extracting a source envelope; fitting a spectral estimation model to the quasi-stationary interferogram; and calculating an axial depth profile using the fitted spectral estimation model.