The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2020

Filed:

Sep. 06, 2016
Applicant:

Nec Corporation, Tokyo, JP;

Inventor:

Takahiro Tsutsui, Tokyo, JP;

Assignee:

NEC CORPORATION, Minato-ku, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 16/18 (2009.01); H04W 24/10 (2009.01); H04W 72/04 (2009.01); H04W 88/08 (2009.01); H04W 88/02 (2009.01); H04W 88/12 (2009.01);
U.S. Cl.
CPC ...
H04W 16/18 (2013.01); H04W 24/10 (2013.01); H04W 72/042 (2013.01); H04W 88/02 (2013.01); H04W 88/08 (2013.01); H04W 88/12 (2013.01);
Abstract

To enable more efficient collection of information for optimal area design targeting a downlink only cell. An apparatus in the present invention includes: an information acquisition unit configured to acquire reporting condition information regarding a condition of reporting performed by a terminal apparatus to a base station; and a communication processing unit configured to transmit the reporting condition information to the terminal apparatus. The reporting is reporting to be used for determining initiation or termination of Minimization of Drive Tests (MDT) measurements for a downlink only cell.


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