The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2020
Filed:
Sep. 30, 2015
Applicant:
Interdigital Vc Holdings, Inc., Wilmington, DE (US);
Inventors:
Cristina Gomila, Cesson-Sevigne, FR;
Joan Llach, Cesson-Sevigne, FR;
Assignee:
INTERDIGITAL VC HOLDINGS, INC., Wilmington, DE (US);
Primary Examiner:
Int. Cl.
CPC ...
H04N 19/46 (2014.01); H04N 19/85 (2014.01); H04N 19/117 (2014.01); H04N 19/136 (2014.01); H04N 19/18 (2014.01); H04N 19/80 (2014.01); H04N 19/44 (2014.01); H04N 19/48 (2014.01);
U.S. Cl.
CPC ...
H04N 19/85 (2014.11); H04N 19/117 (2014.11); H04N 19/136 (2014.11); H04N 19/18 (2014.11); H04N 19/46 (2014.11); H04N 19/44 (2014.11); H04N 19/48 (2014.11); H04N 19/80 (2014.11);
Abstract
Film grain simulation within a receiver () occurs by first obtaining at least one block of pre-computed transformed coefficients. The block of pre-computed transformed coefficients undergoes filtering responsive to a frequency range that characterizes a desired pattern of the film grain. In practice, the frequency range lies within a set of cut frequencies f, f, fand fof a filter in two dimensions that characterizes a desired film grain pattern. Thereafter, the filtered set of coefficients undergoes an inverse transform to yield the film grain pattern.