The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2020

Filed:

Apr. 27, 2017
Applicant:

Sony Corporation, Tokyo, JP;

Inventor:

Mitsuaki Kita, Kanagawa, JP;

Assignee:

SONY CORPORATION, Toyko, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/369 (2011.01); H04N 5/378 (2011.01); H04N 5/232 (2006.01); H04N 5/3745 (2011.01); H04N 9/04 (2006.01);
U.S. Cl.
CPC ...
H04N 5/36961 (2018.08); H04N 5/232122 (2018.08); H04N 5/378 (2013.01); H04N 5/379 (2018.08); H04N 5/37455 (2013.01); H04N 9/04553 (2018.08); H04N 9/04555 (2018.08); H04N 9/04557 (2018.08); H04N 9/04559 (2018.08);
Abstract

The present disclosure relates to a solid-state image pickup element and an electronic apparatus each of which enables a phase difference in an arbitrary direction to be properly detected. A solid-state image pickup element as a first aspect of the present disclosure includes a pixel array, and a plurality of AD conversion portions. The pixel array is partitioned into a plurality of pixel blocks each including a normal pixel and a pixel for phase difference detection. The plurality of AD conversion portions correspond to the respective plurality of pixel blocks, and AD-convert pixel signals based on a plurality of pixels included in the corresponding pixel block. In this case, the pixel for phase difference detection included in one pixel block of the plurality of pixel blocks, and the pixel for phase difference detection included in the other pixel block of the plurality of pixel blocks are arranged in positions corresponding to each other. The present disclosure, for example, can be applied to a CMOS image sensor.


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