The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2020
Filed:
Feb. 08, 2019
Applicant:
Yokowo Co., Ltd., Kita-ku, Tokyo, JP;
Inventor:
Takahiro Nagata, Tomioka, JP;
Assignee:
YOKOWO CO., LTD., Kita-ku, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 17/29 (2015.01); H04B 17/16 (2015.01); G01R 29/08 (2006.01);
U.S. Cl.
CPC ...
H04B 17/29 (2015.01); G01R 29/0878 (2013.01); H04B 17/16 (2015.01);
Abstract
A testing device for testing an antenna-incorporated semiconductor device which is integrated with an antenna is provided. The testing device includes a non-contact probe configured to receive a radio wave emitted from the antenna in a state that the non-contact probe is not in contact with the antenna. The testing device may further include a movable base body configured to be lifted and lowered.
Nagata, Takahiro. (2020). Testing device for antenna-incorporated semiconductor device (U.S. Patent No. 10715262). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10715262
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile