The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2020
Filed:
Aug. 20, 2019
Fluke Corporation, Everett, WA (US);
John Paul Hittel, Phoenix, AZ (US);
William F. Winston, Lake Stevens, WA (US);
Fluke Corporation, Everett, WA (US);
Abstract
A method and a testing device for determining signal-to-noise headroom of a pair of conductors are provided. In the method and testing device, a gain of electric signal transmissions over a pair of conductors is varied to reach a first gain. Prior to reaching the first gain a transition between reception failure and successful reception of the electric signal transmissions does not occur. A first electric signal having the first gain is transmitted over a first end of the pair of conductors and it is determined that the transition between reception failure and successful reception of the first electric signal occurred. A signal-to-noise ratio (SNR) headroom for the pair of conductors is determined based on the first gain at which the transition between reception failure and successful reception occurred.