The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2020
Filed:
Dec. 11, 2018
The Hong Kong Research Institute of Textiles and Apparel Limited, Hong Kong, CN;
The Hong Kong Research Institute of Textiles and Apparel Limited, Hong Kong, CN;
Abstract
The present disclosure provides a method and a computer-readable storage medium for color quality assessment of a batch-sample image based on multispectral imaging. The method comprises: selecting an operation area on a reference image and locating a corresponding operation area on a batch-sample image, wherein the reference image is used for color comparison with the batch-sample image to determine whether the batch-sample image satisfies a pass requirement; generating and comparing the color-information items obtained from the reference image and from the batch-sample image respectively and determine whether the batch-sample image satisfies the pass requirement based on one or more thresholds. This method can be applied to automatically and precisely assess the quality of mixed-color fabrics in textile industry, which is more objective, reliable, and cost-effective, as compared to conventional methods for color quality assessment.