The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10713683 B1

PDF
Full Text
Expired
Date of Patent:
Jul. 14, 2020

Filed:

Jun. 09, 2015
Applicant:

Oath Inc., New York, NY (US);

Inventors:

Yan He, Santa Clara, CA (US);

Miao Chen, Suunyvale, CA (US);

Maria Stone, Pacifica, CA (US);

Assignee:

Oath Inc., New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 30/02 (2012.01); G06Q 10/04 (2012.01);
U.S. Cl.
CPC ...
G06Q 30/0243 (2013.01); G06Q 10/04 (2013.01); G06Q 30/0277 (2013.01);
Abstract

Online experimentation has been widely used to evaluate an effect of a new feature of an online product on user engagement. One challenge is that an existence of outliers can often complicate the analysis of such experimental results. Thus, a procedure is provided herein to detect and remove outliers from experimental results. The procedure can use statistical tests based on parametric distributions of sample maximum or minimum. These tests can be performed using an inward testing procedure to identify multiple outliers. Finally, these filtered test results can be used to control delivery of a new feature of an online product.


Find Patent Forward Citations

He, Yan. (2020). Outlier data detection (U.S. Patent No. 10713683). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10713683

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