The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2020

Filed:

Nov. 09, 2015
Applicant:

Xerox Corporation, Norwalk, CT (US);

Inventor:

David Rozier, Bernin, FR;

Assignee:

Xerox Corporation, Norwalk, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 16/215 (2019.01); G06Q 10/10 (2012.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 16/215 (2019.01); G06Q 10/10 (2013.01);
Abstract

This disclosure provides a method and system to perform data integrity checks in a data warehouse (DWH) feed using machine-learning (ML) processes. According to an exemplary method, a ML integrity check is performed on received data which has been extracted from a plurality of source files, and after ML processes validate the extracted data, the validated data is transformed and loaded to a DWH.


Find Patent Forward Citations

Rozier, David. (2020). Method and system using machine learning techniques for checking data integrity in a data warehouse feed (U.S. Patent No. 10713587). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10713587

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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