The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2020
Filed:
Sep. 07, 2016
Nec Corporation, Minato-ku, Tokyo, JP;
Yoshinori Saida, Tokyo, JP;
Shin Norieda, Tokyo, JP;
Makoto Yoshimoto, Tokyo, JP;
Kota Iwamoto, Tokyo, JP;
Takami Sato, Tokyo, JP;
Ruihan Bao, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
An image acquisition unit () acquires a captured image containing an inspection target instrument. An inspection information acquisition unit () acquires inspection information regarding the instrument contained in the captured image. The inspection information is information indicating an inspection item of the instrument. A first display control unit () displays an indication representing an inspection spot corresponding to the inspection item indicated by the inspection information on the display device (). For example, the first display control unit () displays the indication representing the inspection spot so that the indication is superimposed on the inspection spot on a display device (). For example, the first display control unit () displays the indication in the inspection spot on the display device () or near the instrument.