The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2020
Filed:
Mar. 20, 2018
Applicant:
Welch Allyn, Inc., Skaneateles Falls, NY (US);
Inventors:
William Niall Creedon, Portland, OR (US);
Eric Joseph Laurin, Beaverton, OR (US);
Richard Allen Mowrey, Ottawa, CA;
Assignee:
Welch Allyn, Inc., Skaneateles Falls, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/12 (2017.01); H04N 5/232 (2006.01);
U.S. Cl.
CPC ...
G06K 9/0061 (2013.01); G06T 7/12 (2017.01); H04N 5/23229 (2013.01);
Abstract
A digital imaging system processes digital images of a subject's fundus and/or pupils to determine a pupil edge. Two regions of a digital image are evaluated to determine a threshold value. Typically, the two regions are selected such that each region would usually not include artifacts. The threshold value can then be used to identify a pupil-iris threshold in the digital image. Based on the pupil-iris threshold, pupil edges are identified.