The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2020

Filed:

Dec. 12, 2018
Applicant:

Xilinx, Inc., San Jose, CA (US);

Inventors:

Paul R. Schumacher, Berthoud, CO (US);

Anurag Dubey, Boulder, CO (US);

Pramod Chandraiah, Pleasanton, CA (US);

Stephen P. Rozum, Loveland, CO (US);

Hem C. Neema, San Jose, CA (US);

Assignee:

XILINX, INC., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/00 (2020.01); G06F 30/34 (2020.01); G06F 11/36 (2006.01); G06F 9/445 (2018.01);
U.S. Cl.
CPC ...
G06F 30/34 (2020.01); G06F 9/44505 (2013.01); G06F 11/3624 (2013.01);
Abstract

Embodiments herein describe reconfigurable integrated circuits (ICs) which include programmable logic that can be configured to perform a user task. In one embodiment, the programmable logic is configured as an accelerator. The user may want to gather debug data or profiling data when executing the accelerator. Rather than using debug/profile circuitry disposed in a static region of the IC, the user can provide preferences to a linker which then dynamically configures debug/profile circuitry in a dynamic region of the IC. That is, based on user preferences, the linker can generate customized debug/profile circuitry for monitoring the performance of the accelerator. In one embodiment, the debug/profile circuitry is implemented in the dynamic region of the IC and is tailored to user preferences rather than relying on static, or fixed, debug/profile circuitry. Moreover, the user can retrieve the debug/profiling data on demand using a call back and a device driver.


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