The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2020
Filed:
Nov. 13, 2015
Ebay Inc., San Jose, CA (US);
Tan Chen, Shanghai, CN;
Tan Chen, Shanghai, CN;
Hao Chen, Shanghai, CN;
Yong Zhang, San Jose, CA (US);
Libin Sun, Shanghai, CN;
Xin Li, Shanghai, CN;
eBay Inc., San Jose, CA (US);
Abstract
A system and method for identifying whether data skew is causing delays in a map phase and/or a reduce phase of a query of a distributed database. The system and method identify the values of various metrics relating to a database query. These metrics include map phase and reduce phase durations and various related metrics. The system and method gather statistics of multiple queries to determine correlation levels between the metrics and the map phase and reduce phase durations. Based on the statistics, the system and method determine whether one or both of the map and reduce phases for a query/response are taking longer than expected. If the durations are longer than expected, the system identifies the delay as caused by data skew and informs the originator of the query.