The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2020

Filed:

Jan. 05, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Francisco M. Anaya, Hollister, CA (US);

John Michael Chase, Newmarket, CA;

Yingcong Guan, Richmond Hill, CA;

Roger H.E. Pett, Toronto, CA;

Trong Truong, Markham, CA;

Jian Xu, Ontario, CA;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3624 (2013.01); G06F 11/3612 (2013.01); G06F 11/3636 (2013.01); G06F 11/3664 (2013.01);
Abstract

A computer-implemented method includes generating static analysis data by performing static analysis on a program. A breakpoint is set in the program automatically, by a computer processor, based on the static analysis data. The breakpoint is hit during a runtime of the program. A program bug is automatically identified at a context location of the breakpoint when the breakpoint is hit during the runtime of the program. An interactive debugging session of the program is launched automatically at the context location of the breakpoint, based on the identifying the program bug.


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