The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2020

Filed:

Feb. 28, 2019
Applicant:

Ricoh Company, Ltd., Tokyo, JP;

Inventors:

Takahiro Furukawa, Kanagawa, JP;

Hirokazu Nishikoori, Tokyo, JP;

Assignee:

RICOH COMPANY, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/12 (2006.01); B65C 9/40 (2006.01); B65C 9/46 (2006.01); G06Q 10/06 (2012.01); G06Q 50/04 (2012.01); B65C 3/06 (2006.01); B65C 9/02 (2006.01); G06K 15/02 (2006.01);
U.S. Cl.
CPC ...
G06F 3/1243 (2013.01); B65C 3/06 (2013.01); B65C 9/02 (2013.01); B65C 9/40 (2013.01); B65C 9/46 (2013.01); G06F 3/121 (2013.01); G06F 3/1282 (2013.01); G06K 15/024 (2013.01); G06Q 10/06395 (2013.01); G06Q 50/04 (2013.01); B65C 2009/404 (2013.01); Y02P 90/30 (2015.11);
Abstract

According to an embodiment, management device includes an image formation data management unit and an inspection unit. The image formation data management unit is configured to create a formation order indicating an order of forming an image corresponding to image formation data on a medium to be applied to an application target object. The inspection unit is configured to inspect whether the image formation data in accordance with the formation order matches with a read image obtained by reading the image formed on the medium in accordance with the formation order. The image formation data management unit transmits state information in which the formation order is associated with an image formation state based on at least one of an image formation result of the image formation data and an inspection result obtained by the inspection unit.


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