The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2020
Filed:
Dec. 28, 2018
President and Fellows of Harvard College, Cambridge, MA (US);
The Regents of the University of California, Oakland, CA (US);
Mikhail D. Lukin, Cambridge, MA (US);
Soonwon Choi, Cambridge, MA (US);
Norman Yao, Berkeley, CA (US);
President and Fellows of Harvard College, Cambridge, MA (US);
The Regents of The University of California, Oakland, CA (US);
Abstract
A method for quantum metrology using stable non-equilibrium states of quantum matter, such as many-body quantum spin systems, is disclosed. The approach can utilize quantum correlations in such many-body quantum spin systems stabilized by strong interactions and periodic driving for reduction of noise. As an example, an exemplary protocol to perform Floquet enhanced measurements of an oscillating magnetic field in Ising-interacting spin systems is provided. These approaches allow for circumvention of the interaction-induced decoherence associated with high density spin ensembles and is robust to the presence of noise and imperfections. The protocol is applicable to nanoscale magnetic sensing and other precision measurements.