The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2020
Filed:
Nov. 07, 2017
Abb Schweiz Ag, Baden, CH;
Sangeun Choi, Simsbury, CT (US);
George Q. Zhang, Windsor, CT (US);
Thomas A. Fuhlbrigge, Ellington, CT (US);
Hetal V. Lakhani, Irving, TX (US);
Than Htaik, West Babylon, NY (US);
Gregory Penza, Old Field, NY (US);
Robert Kodadek, Long Beach, NY (US);
William John Eakins, Bloomfield, CT (US);
Gregory F. Rossano, Enfield, CT (US);
ABB Schweiz AG, Baden, CH;
Abstract
A modular device is used to inspect a confined space in a machine. The entire inspection coverage area and corresponding status are mapped so that the inspection location and associated data are graphically visualized. An accelerometer mounted on the device serves as a tilt sensor and also provides data about a collision of the device with the space being inspected or defects therein. The accelerometer data in combination with an odometry system determines the axial position of the device. A gyroscope mounted on the device is used to determine the device heading. The locational information is used to generate an inspection map that provides inspection history, logged data and a reference that are useful in scheduling the next inspection. The output of the gyroscopes can be used to provide haptic feedback to the device operator to maintain proper device orientation.