The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2020

Filed:

Nov. 08, 2016
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventor:

Volker Ohlen, Pliening, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 13/02 (2006.01);
U.S. Cl.
CPC ...
G01R 13/0254 (2013.01);
Abstract

A method for analyzing at least one signal by using a measurement and analyzing device is described. At least one measurement on said signal to be analyzed is conducted in order to obtain at least one measurement value. A diagram comprising said at least one measurement value over the time is provided. A curve of said at least one measurement value over the time is derived from said diagram. At least one trigger function is applied to said derived curve such that a trigger event is generated in case said at least one trigger function is triggered by said derived curve. Further, a measurement and analyzing device is described.


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