The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2020

Filed:

Oct. 19, 2017
Applicant:

General Automation Lab Technologies, Inc., San Francisco, CA (US);

Inventors:

Peter Christey, San Francisco, CA (US);

Alexander Hallock, Redwood City, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2018.01); G01N 35/10 (2006.01); G01N 35/00 (2006.01); G06T 7/73 (2017.01); C12Q 1/6853 (2018.01); C12M 1/26 (2006.01); B01L 3/00 (2006.01); C12M 1/32 (2006.01); C12M 1/04 (2006.01); B01L 3/02 (2006.01);
U.S. Cl.
CPC ...
G01N 35/1081 (2013.01); B01L 3/5085 (2013.01); C12M 23/12 (2013.01); C12M 23/24 (2013.01); C12M 33/04 (2013.01); C12Q 1/6853 (2013.01); G01N 35/00029 (2013.01); G01N 35/00693 (2013.01); G01N 35/1004 (2013.01); G06T 7/74 (2017.01); B01L 3/0244 (2013.01); B01L 2200/025 (2013.01); B01L 2200/0689 (2013.01); B01L 2200/12 (2013.01); B01L 2200/141 (2013.01); B01L 2300/021 (2013.01); B01L 2300/0636 (2013.01); B01L 2300/0681 (2013.01); B01L 2300/0829 (2013.01); B01L 2300/0893 (2013.01); B01L 2300/165 (2013.01); G01N 2035/00148 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/30024 (2013.01); G06T 2207/30204 (2013.01); G06T 2207/30232 (2013.01);
Abstract

A picking instrument for picking biological samples, such as microbial samples, includes a picking pin having a distal tip and three degrees-of-freedom and configured to move in x, y, and z directions. The picking instrument also includes a loading platform comprising a first area and a second area, the first area configured to accommodate and secure a microfabricated chip including a plurality of microwells. The picking pin is programmatically controlled to pick a sample contained in one or more selected microwells of the microfabricated chip and then transfer the sample to a predetermined location at the destination sample holder. Methods of operating the picking instrument, including calibrating the coordinates of the selected microwell(s) relative to a location of the picking pin, are also provided.


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