The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2020
Filed:
Oct. 16, 2017
Applicant:
New York University, New York, NY (US);
Inventors:
Alexej Jerschow, New York, NY (US);
Andrew J. Ilott, Rahway, NJ (US);
Assignee:
NEW YORK UNIVERSITY, New York, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 24/08 (2006.01); G01N 24/10 (2006.01); G01R 33/56 (2006.01); G01R 31/36 (2020.01); G01R 31/385 (2019.01); G01R 33/483 (2006.01);
U.S. Cl.
CPC ...
G01N 24/08 (2013.01); G01N 24/10 (2013.01); G01R 31/385 (2019.01); G01R 33/4833 (2013.01); G01R 33/5608 (2013.01);
Abstract
A method of probing the layers above, at, and below the surface of a conducting region includes exciting nuclear or electronic spins within the conducting region using a first frequency, receiving a second frequency from the conducting region, determining the length scales by the conductivity of the conducting region, the first frequency, and the second frequency, obtaining a depth profile of the conducting region, and indirectly measuring the presence of the surface by characterizing signal distortions above the surface.