The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2020
Filed:
Dec. 03, 2019
Fanuc Corporation, Yamanashi, JP;
Yasushi Okajima, Yamanashi, JP;
FANUC CORPORATION, Yamanashi, JP;
Abstract
A surface damage inspection system for a workpiece, to automate efficient and effective appearance inspection using imaging, includes an illumination unit that emits light to an inspection target surface from four directions including frontward and rearward directions in an X direction and rightward and leftward directions in a Y direction; an imaging unit that captures an image of the inspection target surface; a damage detection unit that detects damage at the inspection target surface using the image of the inspection target surface; a robot to which a damage inspection device including the illumination unit and the damage detection unit is attached; a table on which the workpiece is to be placed; and a controller that controls drive of the robot and the damage inspection device so as to make the damage inspection device inspect the workpiece on the table or the workpiece gripped by the robot.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile