The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2020
Filed:
Dec. 06, 2018
California Institute of Technology, Pasadena, CA (US);
Axel Scherer, Barnard, VT (US);
Amirhossein Nateghi, Pasadena, CA (US);
Taeyoon Jeon, Pasadena, CA (US);
Frank T. Hartley, Arcadia, CA (US);
California Institute of Technology, Pasadena, CA (US);
Abstract
The present disclosure is directed toward a cuvette for holding a test sample during optical interrogation with a light signal. The transmissivity of the cuvette is increased by a geometric anti-reflection layer disposed on at least one surface of the cuvette, where the geometric anti-reflection layer includes a plurality of geometric features that collectively reduce the reflectivity of the interface between the surface and another medium. As a result, more of the interrogation signal passes through the interface. In some embodiments, every surface through which the interrogation signal passes includes a geometric anti-reflection layer. Due to the increased transmissivity of the cuvette, light detected after passing through it can have an improved signal-to-noise ratio and/or the light signal used to interrogate the sample can have lower intensity. In addition, the reduction of the reflectivity of each surface enables the use of low-cost, high-refractive-index materials, such as conventional silicon.