The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2020

Filed:

May. 02, 2016
Applicant:

Shimadzu Corporation, Kyoto-shi, Kyoto, JP;

Inventor:

Akira Aono, Kyoto, JP;

Assignee:

SHIMADZU CORPORATION, Kyoto-shi, Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 1/42 (2006.01); G01N 30/12 (2006.01); G01N 1/44 (2006.01); G01N 35/10 (2006.01); G01N 30/20 (2006.01); G01N 30/24 (2006.01);
U.S. Cl.
CPC ...
G01N 1/42 (2013.01); G01N 1/44 (2013.01); G01N 30/12 (2013.01); G01N 35/1095 (2013.01); G01N 30/24 (2013.01); G01N 2030/128 (2013.01); G01N 2030/207 (2013.01);
Abstract

A carrier gas flow path of at least from a trap to an analyzing portion is shared between a state wherein a sample component is trapped within the trap and a state wherein the sample component is not trapped within the trap. In this case, even after the sample has been introduced into the analyzing portion through the carrier gas flow path, there is a time interval over which the carrier gas flows within the carrier gas flow path. This makes it possible, through the carrier gas that flows within the carrier gas flow path afterward, to remove the sample component from within the flow path, despite there being a sample component within the carrier gas flow path at the time of sample introduction, thus making it possible to prevent the sample component from remaining within the flow path after sample introduction.


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