The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2020

Filed:

May. 21, 2018
Applicant:

The Trustees of Columbia University IN the City of New York, New York, NY (US);

Inventors:

Nanfang Yu, Fort Lee, NJ (US);

Meng Tian, Fort Lee, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 3/04 (2006.01); G01M 3/38 (2006.01); G01L 1/24 (2006.01); G01K 11/32 (2006.01);
U.S. Cl.
CPC ...
G01M 3/04 (2013.01); G01K 11/32 (2013.01); G01L 1/242 (2013.01); G01M 3/38 (2013.01);
Abstract

Systems and methods for detecting a change in at least one physical parameter of a target illuminated by electromagnetic radiation are disclosed herein. The system includes one or more optical fibers, an optical switch, and a photo detector. The optical fiber switch can transmit at least a portion of the electromagnetic radiation into the one or more optical fibers. The optical fibers can have a plurality of sensor nodes. The sensor nodes can induce an interaction between the change in the at least one physical parameter and the transmitted electromagnetic radiation to generate an optical signal. The photo detector can be connected to the one or more optical fibers and measure the optical signal.


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