The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2020
Filed:
Jun. 14, 2018
Kidde Technologies, Inc., Wilson, NC (US);
Lei Liu, Wake Forest, NC (US);
Mark Sherwood Miller, Lakeville, MN (US);
Kidde Technologies, Inc., Wilson, NC (US);
Abstract
A method for detecting and determining a location of an overheat condition includes producing a narrowband optical signal with a laser source and optical pulse generator. The optical signal is sent into the optical fiber. A plurality of reflected optical signals is received. Reflection intensities are detected using a photodetector. The reflection intensities are compared with a triggering threshold. Response times of the reflected optical signals are recorded whenever the reflection intensity of the optical signals is greater than the triggering threshold. The narrowband optical signal is adjusted to another wavelength. An anomaly reflected optical signal is identified using a characteristic of the timings obtained through a range of wavelengths. The location of the overheat condition recorded response times is calculated. The location and existence of the overheat condition is communicated.