The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2020

Filed:

Oct. 10, 2012
Applicant:

Honeywell Intl. Inc., Morristown, NJ (US);

Inventors:

Stephen Forrest Rogoff, Glendale, AZ (US);

LeRoy Ernest Vetsch, Glendale, AZ (US);

Assignee:

Honeywell International Inc., Morris Plains, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 3/08 (2006.01); G01D 3/032 (2006.01);
U.S. Cl.
CPC ...
G01D 3/08 (2013.01); G01D 3/032 (2013.01);
Abstract

A system includes a plurality of sensors measuring a physical parameter; a processing unit communicatively coupled to the plurality of sensors and configured to receive sensor data from each of the plurality of sensors; wherein the processing unit is further configured to compare rates of change between sensor data for each individual sensor of the plurality of sensors and each of the other individual sensors of the plurality of sensors; wherein the processing unit is further configured to perform a first action when the rate of change of each of the plurality of sensors is within a first threshold of all of the other plurality of sensors; and wherein the processing unit is further configured to perform a second action when the rate of change of at least one of the plurality of sensors is not within the first threshold of at least another of the plurality of sensors.


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