The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2020
Filed:
Mar. 19, 2019
Tdk Corporation, Tokyo, JP;
Daisuke Ohtsu, Xiamen, CN;
Taku Masai, Xiamen, CN;
Liu Hailong, Xiamen, CN;
Liang Liping, Xiamen, CN;
TDK CORPORATION, Tokyo, JP;
Abstract
The object of the present invention is to provide the dielectric composition having good specific permittivity, high DC breakdown voltage and AC breakdown voltage, small dielectric loss and heat generating property, and good temperature property even though lead is not substantially used. A dielectric composition of the first aspect includes a, Ca, Bi, Ti, and Sr, wherein the dielectric composition includes two phases having different Sr characteristic X ray intensities when a characteristic X ray intensity derived from Sr is measured by EPMA, and when Srrepresents the characteristic X ray intensity derived from Sr of a first phase measured by EPMA and Srrepresents the characteristic X ray intensity derived from Sr of a second phase measured by EPMA, a ratio (Sr/Sr) of Srwith respect to Srsatisfies 2 or larger. A dielectric composition of the second aspect includes Ba, Ca, Bi, Ti, and Sr, wherein the dielectric composition includes three phases having different Sr characteristic X ray intensities when a characteristic X ray intensity derived from Sr is measured by EPMA, and when Srrepresents the characteristic X ray intensity derived from Sr of a first phase measured by EPMA, Srrepresents the characteristic X ray intensity derived from Sr of a second phase measured by EPMA, and Srrepresents the characteristic X ray intensity derived from Sr of a third phase measured by EPMA, an intensity ratio (Sr/Sr) of Srwith respect to Sris 0.6 or less and an intensity ratio (Sr/Sr) of Srwith respect to Sris 1.4 or more.