The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2020

Filed:

Apr. 26, 2018
Applicant:

Uhv Technologies, Inc., Fort Worth, TX (US);

Inventors:

Nalin Kumar, Fort Worth, TX (US);

Manuel Gerardo Garcia, Jr., Lexington, KY (US);

Kanishka Tyagi, Meerut, IN;

Assignee:

UHV Technologies, Inc., Fort Worth, TX (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B07C 5/34 (2006.01); B07C 5/342 (2006.01); G06N 3/08 (2006.01); G01N 23/223 (2006.01); G06N 20/00 (2019.01); B07C 5/36 (2006.01);
U.S. Cl.
CPC ...
B07C 5/3416 (2013.01); B07C 5/3422 (2013.01); G01N 23/223 (2013.01); G06N 3/08 (2013.01); G06N 20/00 (2019.01); B07C 5/368 (2013.01); B07C 2501/0054 (2013.01); G01N 2223/643 (2013.01);
Abstract

A material sorting system sorts materials utilizing a vision system that implements a machine learning system in order to identify or classify each of the materials, which are then sorted into separate groups based on such an identification or classification. The material sorting system may include an x-ray fluorescence system to perform a classification of the materials in combination with the vision system, whereby the classification efforts of the vision system and x-ray fluorescence system are combined in order to classify and sort the materials.


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