The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2020
Filed:
Jan. 15, 2018
Applicant:
Electronics and Telecommunications Research Institute, Daejeon, KR;
Inventors:
SooYeul Lee, Daejeon, KR;
Jang Hwan Choi, Daejeon, KR;
Assignee:
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE, Daejeon, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 6/02 (2006.01); A61B 90/00 (2016.01);
U.S. Cl.
CPC ...
A61B 6/583 (2013.01); A61B 6/027 (2013.01); A61B 90/39 (2016.02); A61B 2090/3966 (2016.02); G05B 2219/37008 (2013.01);
Abstract
Provided is a calibration device for three-dimensional imaging equipment including a first bead group including first beads arranged in a first pattern, and a second bead group including second beads arranged in a second pattern different from the first pattern, wherein the first and second bead groups have different cross ratios or different segment ratios from each other, the first beads are arranged in a line, and the second beads are arranged in a line.