The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2020

Filed:

Mar. 30, 2015
Applicant:

University of Utah Research Foundation, Salt Lake City, UT (US);

Inventors:

James M. Hotaling, Salt Lake City, UT (US);

Randy C. Bowen, Mendon, UT (US);

Alvin Y. Le, Boise, ID (US);

Matthew I. Converse, Salt Lake City, UT (US);

Andrew W. Southwick, Salt Lake City, UT (US);

Tab S. Robbins, Layton, UT (US);

Kent Ogden, Salt Lake City, UT (US);

Scott McClellan, Park City, UT (US);

Brian Holt, North Salt Lake, UT (US);

Assignee:

University of Utah Research Foundation, Salt Lake City, UT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/20 (2006.01); B01L 3/00 (2006.01); G01F 1/56 (2006.01); G01N 27/22 (2006.01); G01N 33/493 (2006.01); A61B 10/00 (2006.01); A61B 5/145 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
A61B 5/208 (2013.01); A61B 5/14507 (2013.01); A61B 10/007 (2013.01); B01L 3/502 (2013.01); G01F 1/56 (2013.01); G01N 27/221 (2013.01); G01N 33/493 (2013.01); A61B 5/0002 (2013.01); A61B 2560/0223 (2013.01); A61B 2560/0238 (2013.01); A61B 2560/0431 (2013.01); A61B 2562/0214 (2013.01); B01L 2200/0605 (2013.01); B01L 2200/143 (2013.01); B01L 2200/148 (2013.01); B01L 2300/0627 (2013.01); B01L 2300/0832 (2013.01); B01L 2300/0848 (2013.01);
Abstract

A fluid analysis device including a fluid receipt chamber, a first capacitive element for measuring fluid flow into the fluid receipt chamber and a controller operatively coupled to the first capacitive element, wherein the controller is configured to measure a first capacitance of the first capacitive element.


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