The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2020
Filed:
Mar. 25, 2019
Applicant:
Sony Corporation, Tokyo, JP;
Inventors:
Assignee:
Sony Corporation, , JP;
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/32 (2006.01); H01L 51/56 (2006.01); H01L 27/12 (2006.01); G09G 3/3233 (2016.01); G09G 3/3266 (2016.01);
U.S. Cl.
CPC ...
H01L 27/3276 (2013.01); G09G 3/3233 (2013.01); G09G 3/3266 (2013.01); H01L 51/56 (2013.01); G09G 2300/0426 (2013.01); G09G 2300/0814 (2013.01); G09G 2300/0819 (2013.01); G09G 2300/0842 (2013.01); G09G 2300/0866 (2013.01); G09G 2320/043 (2013.01); G09G 2330/08 (2013.01); H01L 27/124 (2013.01); H01L 2251/5392 (2013.01); H01L 2251/568 (2013.01);
Abstract
The present invention relates to an image display device and a method for repairing a short circuit failure. The present invention is applicable to, for example, an active matrix type image display device using an organic EL device, and a short circuit location between wiring patterns is able to be repaired. In a scanning line WSL or a signal line DTL, a bypass wiring pattern BP for bypassing a region where the signal line DTL and the scanning line WSL intersect with each other is provided. By using the bypass wiring pattern BP, a short circuit location between wiring patterns is repaired.