The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2020

Filed:

Sep. 25, 2018
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Lorenzo Sorgi, Seattle, WA (US);

Pramod Sreenivasa, Snoqualmie, WA (US);

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/80 (2017.01); H04N 7/18 (2006.01);
U.S. Cl.
CPC ...
G06T 7/80 (2017.01); H04N 7/181 (2013.01); G06T 2207/30244 (2013.01);
Abstract

A plurality of cameras obtain images in an environment. Calibration data about the translation and rotation of the cameras is used to support functionality such as determining a location of an object that appears in those images. To determine the calibration data, images are processed to determine features produced by points in the environment. A cluster is designated that includes the images of the same point as viewed from at least some of the cameras. A triangulation matrix and back-projection error are calculated for each cluster. These triangulation matrices and back-projection errors are then perturbed to find the translation and rotation that minimize eigenvalues and eigenvectors representative of the feature. The eigenvalues and eigenvectors are then used to determine the rotation and translation of the respective cameras with respect to an origin.


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