The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2020

Filed:

Sep. 24, 2019
Applicant:

Aisin Seiki Kabushiki Kaisha, Kariya-shi, Aichi-ken, JP;

Inventors:

Yuya Yamada, Kariya, JP;

Takashi Kato, Kariya, JP;

Hironobu Hoda, Kariya, JP;

Assignee:

AISIN SEIKI KABUSHIKI KAISHA, Kariya-shi, Aichi-ken, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/70 (2017.01); G06T 7/73 (2017.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/75 (2017.01); G06K 9/00604 (2013.01); G06T 2207/30201 (2013.01);
Abstract

An eyeball information estimation device includes: an acquisition unit acquiring an image including a pupil of a subject and a Purkinje image of the subject; a detection unit detecting a center position of the pupil and a position of the Purkinje image; a selection unit selecting which of first and second sight line angle calculation processings of calculating a sight line angle of the eye of the subject is to be executed; and a processing unit estimating an eyeball center position of the subject based on a three-dimensional face model and updating an eyeball center position of a storage unit, at least on a condition that a pupil reliability is higher than a first pupil threshold value, and a Purkinje reliability is higher than a first Purkinje threshold value, when the first sight line angle calculation processing is selected.


Find Patent Forward Citations

Loading…